Linear test sequences for detecting functionally faulty RAM's

Abstract

In this paper we deal with the detection of functional faults in RAM's. We present a fault model which consists of decoder faults and memory array faults. We rectify and extend previous definitions of decoder faults, and we refine previous definitions of two coupling faults. Three test sequences of length 9N, 13N and 17N are presented with proofs of increasing detection capabilities. Our test sequence of length 17N is capable of detecting all combinations of faults in our model. © 1993.