Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
This paper describes techniques for mitigating single event upsets in master-slave flip-flop latches in 65 nm SOI device technology. Techniques are explained, modeled, and measured with hardware experiments. © 2007 IEEE.
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
Ethan H. Cannon, Michael S. Gordon, et al.
IRPS 2008
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS
Ethan H. Cannon, Michael S. Gordon, et al.
IRPS 2008