R. Ghez, J.S. Lew
Journal of Crystal Growth
Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
R. Ghez, J.S. Lew
Journal of Crystal Growth
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Lawrence Suchow, Norman R. Stemple
JES