C.C. Williams, H.K. Wickramasinghe
Applied Physics Letters
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.
C.C. Williams, H.K. Wickramasinghe
Applied Physics Letters
H.K. Wickramasinghe, Y. Martin
Journal of Applied Physics
H.K. Wickramasinghe
Proceedings of SPIE 1989
C.C. Williams, H.K. Wickramasinghe
Microelectronic Engineering