PaperElectrical-resistivity model for polycrystalline films: The case of arbitrary reflection at external surfacesA.F. Mayadas, M. ShatzkesPhysical Review B
PaperSi-YBaCuO intermixing and reactive patterning techniqueQ.Y. Ma, E.S. Yang, et al.Journal of Electronic Materials
PaperInvestigation of In-Situ Ag/YBCO Contacts for SNS DevicesR.P. Robertazzi, A. W Kleinsasser, et al.IEEE TAS
PaperTunneling sandwich structures using single-crystal niobium filmsR.B. Laibowitz, J.J. CuomoJournal of Applied Physics