Conference paper
The stability of triangular 'droplet' phases on Si(1 1 1)
J.B. Hannon, J. Tersoff, et al.
Journal of Crystal Growth
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
J.B. Hannon, J. Tersoff, et al.
Journal of Crystal Growth
J. Falta, M. Copel, et al.
Applied Physics Letters
L. Smit, R.M. Tromp, et al.
Physical Review B
R.M. Tromp, M. Copel, et al.
Review of Scientific Instruments