Growth temperature dependence of magnetoresistance in co/cu (III) wedged superlattices

Abstract

The magnetoresistance of MBE deposited Co/Cu(111) superlattices as a function of Cu layer thickness is studied at various growth temperature. Wedged superlattices are fabricated with uniform Co layers but with Cu layers whose thickness varies with position along thee length of the substrate. Cu thickness is varied over the range 7-75 Angstrom. Only one maximum in magnetoresistance (MR) is observed for a Cu layer thickness≈10 Angstrom for all growth temperatures studied (0°, 150°, 200°C). The optimal magnetoresistance values are achieved with 150°C growth temperature.