The DX centre
T.N. Morgan
Semiconductor Science and Technology
FexPt100-x films were grown on MgO(111) by co-sputtering Fe and Pt. Composition of the films was determined by Rutherford backscattering spectrometry with an accuracy of 1%. Epitaxy and alloy ordering were quantified by x-ray diffraction and the order parameter was determined to be 0.97 for a film with x=30 and 0.99 for a film with x=25. Neutron diffraction measurements established the presence of an antiferromagnetic phase at T=100 K in 500 nm FePt3 samples grown on MgO(111). Since FePt3 can be grown as an ordered antiferromagnet and a disordered ferromagnet, these films provide a pathway to grow lattice matched interfaces for exchange bias studies. © 2005 American Vacuum Society.
T.N. Morgan
Semiconductor Science and Technology
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications