PaperIn situ scanning-tunneling-microscopy studies of current driven mass transport in AgL.E. Levine, G. Reiss, et al.Journal of Applied Physics
PaperEffect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy filmsB.Z. Weiss, K.N. Tu, et al.Journal of Applied Physics
PaperA technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.M.M.J. Treacy, W. Krakow, et al.Applied Physics Letters
