S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
We have studied the fractional quantization of the Hall resistance at 0.51 K in two-dimensional hole systems formed at p+ interfaces with mobilities as high as 8.0 × 104 cm2/Vs at 4 K. In addition to the Hall quantization for a fractional filling factor =23, we report for the first time the observation of an almost fully developed Hall plateau at =35 and the existence of weak but distinct structure in the magnetoresistance for =37 and 65. Similarly, magnetoresistance minima occurred at =53, 43, 23, 35, and 25. In contrast with two-dimensional electron systems, conspicuously absent was any magnetoresistance feature in the vicinity of =45. © 1984 The American Physical Society.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
P.C. Pattnaik, D.M. Newns
Physical Review B
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
T.N. Morgan
Semiconductor Science and Technology