The DX centre
T.N. Morgan
Semiconductor Science and Technology
We present a comprehensive theoretical approach to determine concentrations of dopant impurities in semiconductors. The formalism is applied to the problem of acceptor doping in ZnSe. Formation energies and concentrations of impurities and native defects are expressed as a function of chemical potentials, for which experimentally accessible ranges are calculated. We show that limitations in the achievable hole concentrations can be explained by two mechanisms: one is the competition between various substitutional and interstitial configurations (compensation), the other is the solubility limit imposed by formation of other phases. Nitrogen is most promising among the dopants examined. © 1993 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997