R.J. Von Gutfeld, D.R. Vigliotti, et al.
Applied Physics Letters
A correlation between the surface morphology of slant-angle deposited films and the magnitude of the transverse thermoelectric voltage has been observed. This finding has been mainly responsible for the fabrication of optical detectors with responsivities greatly enhanced over those previously reported, extending to 10.6 μ and into the cw range. © 1974 American Institute of Physics.
R.J. Von Gutfeld, D.R. Vigliotti, et al.
Applied Physics Letters
R.J. Von Gutfeld, J.R. Lankard
Opto-electronics
R.J. Von Gutfeld, R.T. Hodgson
Applied Physics Letters
R.J. Von Gutfeld
International Conference on Laser Processing and Diagnostics 1983