LASER ENHANCED PLATING AND ETCHING: A REVIEW.
R.J. Von Gutfeld
International Conference on Laser Processing and Diagnostics 1983
We have measured the transverse voltage from slant-angle-deposited metal films due to laser illumination as a function of film geometry. For a fixed laser spot size, the voltage is found to vary inversely with film width d for d small compared to contact separation a. For d/a ≥∼1 the voltage approaches a constant. The experimental results are in good agreement with the open-circuit voltage from a finite-current dipole and consistent with the thermoelectric model previously proposed. Useful design parameters for transverse thermoelectric optical detectors are implied by the data.
R.J. Von Gutfeld
International Conference on Laser Processing and Diagnostics 1983
R.J. Von Gutfeld
Optics and Laser Technology
R.J. Von Gutfeld, R. Srinivasan
Applied Physics Letters
R.J. Von Gutfeld, A.H. Nethercot Jr.
Journal of Applied Physics