M. Heiblum, M.I. Nathan, et al.
Surface Science
A novel method involving internal photoemission has been developed to determine the conduction band discontinuity Δ Ec of heterojunctions. The method is straightforward, accurate, and assumes minimum unknowns; and has been applied to GaAs/AlxGa1-xAs heterojunctions. We have found for x<0.4 that Δ Ec≅0.62 Δ Eg, where Δ Eg is the band-gap difference. For x>0.4, the apparent Δ Ec is considerably smaller.
M. Heiblum, M.I. Nathan, et al.
Surface Science
K. Seo, M. Heiblum, et al.
Applied Physics Letters
C.M. Knoedler, L. Osterling, et al.
Journal of Applied Physics
M. Eizenberg, D.A. Smith, et al.
Applied Physics Letters