PublicationSurface SciencePaperElectron scattering in silicon inversion layers by oxide and surface roughnessSurface ScienceView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Aug 1976PublicationSurface ScienceAuthorsA. HartsteinT.H. NingA.B. FowlerIBM-affiliated at time of publicationTopicsPhysical SciencesMaterials DiscoveryShare