PaperProximity effect in electron beam patterned x-ray masksC.P. Umbach, A.N. BroersApplied Physics Letters
PaperRapid writing of fine lines in Langmuir-Blodgett films using electron beamsA.N. Broers, M. PomerantzThin Solid Films
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
