Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Paper
Electrical properties of vacuum annealed Si surfaces
Abstract
No abstract available.
Related
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
Hiroshi Ito, Reinhold Schwalm
JES
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting