Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
10 Mar 2004

Effect of thin-film imaging on line edge roughness transfer to underlayers during etch processes

View publication

Abstract

No abstract available.

Related

Paper

Characterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scattering

J.V. Harzer, B. Hillebrands, et al.

Journal of Magnetism and Magnetic Materials

Paper

Studies of Chain Conformational Kinetics in Poly(di-n-alkylsilanes) by Spectroscopic Methods. 4. Piezochromism in Symmetrical Poly(di-n-alkylsilanes)

Kigook Song, Robert D. Miller, et al.

Macromolecules

Paper

Effects of mask materials on near field optical nanolithography

Sharee J. McNab, Richard J. Blaikie

Materials Research Society Symposium - Proceedings

Paper

Schottky contacts to cleaved GaAs (110) surfaces. I. Electrical properties and microscopic theories

A.B. McLean, R.H. Williams

Journal of Physics C: Solid State Physics

View all publications
  1. Home
  2. ↳ Publications

Date

10 Mar 2004

Publication

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Authors

  • Dario L. Goldfarb
  • Arpan P. Mahorowala
  • Gregg M. Gallatin
  • Karen E. Petrillo
  • Karen Temple
  • Marie Angelopoulos
  • Stacy Rasgon
  • Herbert H. Sawin
  • Scott D. Allen
  • Margaret C. Lawson
  • Ranee W. Kwong
IBM-affiliated at time of publication

Topics

  • Physical Sciences

Resources

  • Publication

Share