Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Self-diffusion measurements have been made in polycrystalline Au-1.2 at.% Ta alloy over the temperature range 204°-395.5 °C using 195Au radioactive tracer and r.f. backsputtering techniques for serial sectioning. Self-diffusion coefficients were obtained in the lattice, dislocation networks (subgrains) and large angle grain boundaries and these yielded Arrhenius parameters for the three diffusion processes. A small addition of Ta to Au was found to have profound effects on Au diffusion in the lattice and along grain boundaries. © 1975.
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
R. Ghez, J.S. Lew
Journal of Crystal Growth
J.H. Stathis, R. Bolam, et al.
INFOS 2005
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS