M.H. Brodsky, D.P. Di Vincenzo
Journal of Non-Crystalline Solids
The recombination lifetime in phosphorus-doped hydrogenated amorphous silicon is determined from the dispersive photocurrent decay following a short-pulse excitation. The electron drift mobility and dispersion parameter α are obtained as well. It is found that α is temperature dependent as expected for extended-state transport controlled by multiple trapping. A lower limit to the extended-state mobility is determined: μc>~1 cm2/V.s. © 1980 The American Physical Society.
M.H. Brodsky, D.P. Di Vincenzo
Journal of Non-Crystalline Solids
J.A. Kash, J.C. Tsang, et al.
Physical Review Letters
M.H. Brodsky, P.J. Stiles
Physical Review Letters
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Applied Physics Letters