Direct observation of magnetization switching in focused-ion-beam- fabricated magnetic nanotubes

Abstract

In this letter, a direct measurement of "easy" magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60×60nm2, and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam- fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially "easier" switching. © 2002 American Institute of Physics. © 2002 American Institute of Physics.