Recent developments in holographic scanning
L.D. Dickson, R.S. Fortenberry, et al.
Proceedings of SPIE 1989
Programs written to assist in the design and evaluation of microelectronic lenses are briefly described. Over the past 15 years, several families of lenses were designed using these programs. Basically, the higher order aberrations are mapped for a series of similar designs with corrected Seidel aberrations. The OTF program is used to guide the final stages of design. Two lens structures are described that a fully automatic program could not produce. The last section deals with the practical aspects of making lens elements, mechanical assembly, and testing completed objectives. © 1980 SPIE.
L.D. Dickson, R.S. Fortenberry, et al.
Proceedings of SPIE 1989
J. Twieg, C. Grant Willson, et al.
Proceedings of SPIE 1989
Norman Bobroff, Petra Fadi, et al.
Proceedings of SPIE 1989
Chu R. Wie, K. Xie, et al.
Proceedings of SPIE 1989