Keith A. Jenkins, David F. Heidel
Microelectronic Engineering
Paper
Corroborating Cutoff Frequency Measurements with DC Gain Measurements
Abstract
A test for the correct measurement of cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by network analyzer, and by dc current measurements. The method is described, and sample data are shown to demonstrate its practical application. © 1991 IEEE
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