L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Wafer-scale graphene devices processed entirely in a standard 200 mm silicon fab are demonstrated for the first time. New embedded gate structures enable full saturation of the drain current in graphene FETs with sub-μm channels, resulting in high intrinsic voltage gain. In addition, passive devices were monolithically integrated with graphene transistors to form the first GHz-range graphene IC using large-scale CVD graphene. The demonstration of high performance graphene FETs and IC fabricated using a 200 mm platform is a major step in transitioning this promising material from a scientific curiosity into a real technology. © 2011 IEEE.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
M. Hamaguchi, Deleep R. Nair, et al.
IEDM 2011
J.A. Barker, D. Henderson, et al.
Molecular Physics