PaperStudy of electromigration-induced resistance and resistance decay in Al thin-film conductorsJ.R. Lloyd, R.H. KochApplied Physics Letters
PaperThe subgap current in Nb/AlOx/Nb tunnel junctionsF.P. Milliken, R.H. Koch, et al.Applied Physics Letters
PaperMagnetic field dependence of resonant tunneling in thin metal-oxide-semiconductor structuresA. Hartstein, R.H. KochPhysical Review B
PaperMeasurement of the exponent μ in the low-temperature phase of YBa2Cu3O7-δ films in a magnetic field: Direct evidence for a vortex-glass phaseC. Dekker, W. Eidelloth, et al.Physical Review Letters
