Characterization of Resistive Transmission Lines to 70 GHz with Ultrafast Optoelectronics

Abstract

The complete characterization of resistive transmission lines with the short-pulse propagation technique is extended to 70 GHz. The wide-frequency coverage is made possible by the use of ultrafast photoconductive switches for pulse generation and sampling. The picosecond optoelectronic sampling oscilloscope is described and results of measurements on thin-film strip transmission lines are presented. © 1993 IEEE