A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2004
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2004
G. Arjavalingam, Barry J. Rubin
SPIE OE/LASE 1988
J.H. Glownia, G. Arjavalingam, et al.
Optics Letters
W. Robertson, G. Arjavalingam, et al.
Electronics Letters