G.V. Kopcsay, G. Arjavalingam, et al.
Advances in Semiconductors and Semiconductor Structures 1987
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
G.V. Kopcsay, G. Arjavalingam, et al.
Advances in Semiconductors and Semiconductor Structures 1987
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