Conference paper
Chip-to-chip optical interconnects
J.A. Kash, F.E. Doany, et al.
OFC/NFOEC 2006
Backside optical emission was used to diagnose excess quiescent current in a multimillion gate microprocessor. Emission images showed the current was due to FET's improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered.
J.A. Kash, F.E. Doany, et al.
OFC/NFOEC 2006
B. Pezeshki, D. Kuchta, et al.
CLEO 1996
J.A. Kash, R. Ulbrich, et al.
QELS 1989
J.C. Tsang, J.A. Kash
Physical Review B