D.R. Knebel, P.N. Sanda, et al.
IEEE ITC 1998
Backside optical emission was used to diagnose excess quiescent current in a multimillion gate microprocessor. Emission images showed the current was due to FET's improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered.
D.R. Knebel, P.N. Sanda, et al.
IEEE ITC 1998
J.C. Tsang, J.A. Kash
Proceedings of SPIE 1989
J.A. Kash, S.S. Jha, et al.
Physical Review Letters
J.C. Tsang
Solid State Communications