PublicationMicroscopy and MicroanalysisPaperBackscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detectorMicroscopy and MicroanalysisView publicationAbstractNo abstract available.Home↳ PublicationsDate03 Aug 2008PublicationMicroscopy and MicroanalysisAuthorsL. GignacO.C. WellsC.-K. HuJ. BruleyC.E. MurrayA. FryeIBM-affiliated at time of publicationShare
