Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector

S. Cohen, J.C. Liu, et al.

MRS Spring Meeting 1999

R. Filippi, M. Gribelyuk, et al.

Thin Solid Films

L. Gignac, V. Svilan, et al.

MRS Fall Meeting 1996

O.C. Wells

Scanning