O.C. Wells, C.G. Bremer
Journal of Physics E: Scientific Instruments
Paper
Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector
Related
O.C. Wells, C.G. Bremer
Journal of Physics E: Scientific Instruments
Conference paper
Characterization of plated Cu thin film microstructures
L. Gignac, K.P. Rodbell, et al.
MRS Spring Meeting 1999
J.M.E. Harper, C. Cabral Jr., et al.
Journal of Applied Physics