Application of an InSb flat crystal with elliptically shaped modulated structures to x-ray point focusing

Abstract

Obtained experimental results demonstrate that x rays can be focused to a point by using one flat InSb crystal with elliptically shaped modulated structures based on the Bragg and Fresnel diffraction principles. Ti Kα radiation and InSb (111) reflections are used to focus a 20-μm source size to a point of 9 μm, which is in good agreement with predictions from the wave-optics approach. The quality of the modulated structure fabrication is judged by the shape of the focal spot, which indicates no visible aberration effects. ©1996 American Institute of Physics.