PaperCharacteristics of the annealing kinetics of tin films deposited at 88°KJ.R. Priest, C. Chiou, et al.Journal of Applied Physics
PaperStress Anisotropy in Silicon Oxide FilmsJ.R. Priest, H.L. Caswell, et al.Journal of Applied Physics
PaperStripping effects in the reactions C12(He3, p)N14 and C12(He3, d)N13 at 13.9 MevJ.R. Priest, D.J. Tendam, et al.Physical Review
PaperLow-temperature properties of evaporated lead filmsH.L. Caswell, J.R. Priest, et al.Journal of Applied Physics
