Eric J. Fluhr, Joshua Friedrich, et al.
ISSCC 2014
VLSI technology is facing an extreme challenge due to the miniaturization and complexity of leading-edge products. Density control is a must step to ensure the yield and performance for the manufacturing smaller, faster and cheaper chips. A fundamental problem in the density control is how to calculate density correctly and efficiently. In this paper, we propose a simple but efficient two-level hierarchical approach to exactly identify the maximum density window for a given layout. Comparing with the latest work [7], the new algorithm shows big runtime reductions on testcases which have a long runtime with [7]. ©2009 IEEE.
Eric J. Fluhr, Joshua Friedrich, et al.
ISSCC 2014
Ruchir Puri, David S. Kung
VLSID/Embedded 2010
Ruchir Puri, Leon Stok, et al.
DAC 2003
Rajiv Joshi, Rouwaida Kanj
ICICDT 2009