Shiyi Wei, Omer Tripp, et al.
FSE 2016
Instrumenting code to collect profiling information can cause substantial execution overhead. This overhead makes instrumentation difficult to perform at runtime, often preventing many known offline feedback-directed optimizations from being used in online systems. This paper presents a general framework for performing instrumentation sampling to reduce the overhead of previously expensive instrumentation. The framework is simple and effective, using code-duplication and counter-based sampling to allow switching between instrumented and non-instrumented code. Our framework does not rely on any hardware or operating system support, yet provides a high frequency sample rate that is tunable, allowing the tradeoff between overhead and accuracy to be adjusted easily at runtime. Experimental results are presented to validate that our technique can collect accurate profiles (93-98% overlap with a perfect profile) with low overhead (averaging ∼6% total overhead with a naive implementation). A Jalapeño-specific optimization is also presented that reduces overhead further, resulting in an average total overhead of ∼3%. © 2001 ACM.
Shiyi Wei, Omer Tripp, et al.
FSE 2016
Alexander Tarvo, Peter F. Sweeney, et al.
ISSTA 2015
Marc Fisher II, Jan Wloka, et al.
PASTE 2011
Prasad Kulkarni, Matthew Arnold, et al.
VEe 2007