Effect of preformed IMC layer on electromigration of solder capped cu pillar bump interconnection on an organic substrateYasumitsu OriiKazushige Toriyamaet al.2012IMAPS 2012
Assessment of XRF technique as a method to measure percent ag in SnAg solders for flip chip applicationsJennifer D. SchulerChia-Hsin Shihet al.2012IMAPS 2012
Formulation of percolating thermal underfills using hierarchical self-assembly of micro- and nanoparticles by centrifugal forces and capillary bridgingThomas BrunschwilerGerd Schlottiget al.2012IMAPS 2012