Publications

3 results at VLSI-TSA 2013

Improving and optimizing reliability in future technologies with high-κ dielectrics
- - Barry P. Linder
  - Eduard Cartier
  - et al.
- 2013
- VLSI-TSA 2013
Device design considerations for next generation CMOS technology: Planar FDSOI and FinFET (Invited)
- - Bruce Doris
  - Kangguo Cheng
  - et al.
- 2013
- VLSI-TSA 2013
A perspective on future nanoelectronic devices
- - Tak H. Ning
- 2013
- VLSI-TSA 2013