Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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3 results at IEEE ITC 1983

TEST GENERATION FOR FET SWITCHING CIRCUITS.
- - J.P. Roth
  - Vojin G. Oklobdzija
  - et al.
- 1983
- IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- - J.Lawrence Carter
- 1983
- IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- - J.Lawrence Carter
- 1983
- IEEE ITC 1983