Publications

2 results at IEEE ITC 2005

Testing and debugging delay faults in dynamic circuits
- - Ramyanshu Datta
  - Sani Nassif
  - et al.
- 2005
- IEEE ITC 2005
An advanced optical diagnostic technique of IBM z990 eServer microprocessor
- - Peilin Song
  - Franco Stellari
  - et al.
- 2005
- IEEE ITC 2005