Oxide-charge-induced impurity band in silicon inversion layersA. HartsteinA.B. Fowler1976Surface Science
Screening and level broadening in inversion layers with random fixed chargesFrank Stern1976Surface Science
Electron scattering in silicon inversion layers by oxide and surface roughnessA. HartsteinT.H. Ninget al.1976Surface Science
Cluster model calculation and photoemission studies of molecularly adsorbed NO on NiI.P BatraC.R Brundle1976Surface Science
Use of misfit strain to remove dislocations from epitaxial thin filmsJ.W. MatthewsA.E. Blakesleeet al.1976Thin Solid Films
Effect of interdiffusion on the elasticity and internal friction of compositionally modulated copper-nickel thin filmsB.S. BerryW.C. Pritchet1976Thin Solid Films
Adhesion of copper films to aluminum oxide using a spinel structure interfaceGerald Katz1976Thin Solid Films
Hydrogen induced interfacial polarization at PdSiO2 interfacesIngemar LundströmThomas DiStefano1976Surface Science
Deconvolution method for composition profiling by Auger sputtering techniqueP.S. HoJ.E. Lewis1976Surface Science