Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometryC.R. Brundle1980Thin Solid Films
The effects of oxygen and copper impurities on the structure of amorphous germaniumJ.F. Graczyk1980Thin Solid Films
Hills or hollows? — An ambiguity in the determination of surface corrugationK.H. RiederA. Baratoffet al.1980Surface Science
On the problem of whether mass or chemical bonding is more important to bombardment-induced compositional changes in alloys and oxidesRoger Kelly1980Surface Science
Conventions and formulas for using the Mueller-Stokes calculus in ellipsometryP.S. HaugeR.H. Mulleret al.1980Surface Science
Surface plasmons as a probe of the electrochemical interfaceJ.G. Gordon IIS. Ernst1980Surface Science
Viscous flow and crystallization of a metallic glassTakeshi TakamoriTadashi Mizoguchiet al.1980Materials Research Bulletin
Thermopower and transport properties of AsF5-doped polyacetyleneJ.F. KwakW.D. Gillet al.1980Synthetic Metals