Properties and Microelectronic Applications of Thin Films of Refractory Metal Nitrides
- Marc Wittmer
- 1985
- JVSTA
Publications
3510 results for Materials Discovery
Inverse photoemission from an unoccupied surface state band on Ag(110)
- B. Reihl
- R.R. Schlittler
- et al.
- 1985
- Surface Science
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopy
- J.E. Lewis
- M.O. Aboelfotoh
- et al.
- 1985
- JVSTA
Thin films for optical data storage
- Wen-yaung Lee
- 1985
- JVSTA
Rotational polarization in NO scattering from Ag(111)
- A.W. Kleyn
- A.C. Luntz
- et al.
- 1985
- Surface Science
Reactive sputtering of copper and silicon near the sputtering threshold
- T.M. Mayer
- J.M.E. Harper
- et al.
- 1985
- JVSTA
Summary Abstract: Thin films for magnetic recording technology: A review
- J.K. Howard
- 1985
- JVSTA
Secondary electron effect on power-voltage relationship in rf sputtering
- B. Bumble
- J.J. Cuomo
- 1985
- JVSTA
Characterization of electron-beam deposited tungsten films on sapphire and silicon
- J.H. Souk
- J.F. O'Hanlon
- et al.
- 1985
- JVSTA
Summary Abstract: Modification of metals by low energy ions during thin film deposition
- J.M.E. Haroer
- J.J. Cuomo
- 1985
- JVSTA