Chemical bonding and Schottky barrier formation at transition metal-silicon interfacesPaul S. Ho1983JVSTA
Summary Abstract: Crystallographic structure of coevaporated Ni-Al alloy filmsH.T.G. HentzellB. Anderssonet al.1983JVSTA
Correlation between the ion bombardment during film growth of Pd films and their structural and electrical propertiesP. ZiemannE. Kay1983JVSTA
Test of structural models for Ag{110}1 2-0 by LEED intensity analysisE. ZanazziM. Magliettaet al.1983JVSTA
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfacesR. BlitzG.W. Rubloffet al.1983JVSTA
Summary Abstract: Preparation of Pb-Bi film by alloy evaporation II. Microstructure and morphologyH.-C.W. HuangC.M. Serrano1983JVSTA