A unified outlier detection method for trace data analysis in semiconductor manufacturing
- Zhiguo Li
- Robert J. Baseman
- et al.
- 2013
- IIE-AC 2013
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46 results for Yada Zhu
Virtual metrology and run-to-run control in semiconductor manufacturing
- Yada Zhu
- Robert J. Baseman
- et al.
- 2012
- ISSAT-RQD 2012
Hierarchical multi-task learning with application to wafer quality prediction
- Jingrui He
- Yada Zhu
- 2012
- ICDM 2012
Hierarchical modeling with tensor inputs
- Yada Zhu
- Jingrui He
- et al.
- 2012
- AAAI/IAAI 2012
Optimal design of accelerated life testing plans under progressive censoring
- Yada Zhu
- Elsayed A. Elsayed
- 2011
- ISSAT-RQD 2011
ArieL: Adversarial Graph Contrastive Learning
- Shengyu Feng
- Baoyu Jing
- et al.
- 2024
- ACM TKDD
Heterogeneous representation learning with separable structured sparsity regularization
- Pei Yang
- Qi Tan
- et al.
- 2017
- KAIS
Modeling the firm's response to research & development tax credit policies
- Yuchen Li
- Yada Zhu
- et al.
- 2017
- Engineering Economist
Co-clustering structural temporal data with applications to semiconductor manufacturing
- Yada Zhu
- Jingrui He
- 2016
- ACM TKDD
Design of equivalent accelerated life testing plans under different stress applications
- Yada Zhu
- Elsayed A. Elsayed
- 2016
- Quality Technology and Quantitative Management