Publications

3 results for Yongchan Ban

Layout optimizations for double patterning lithography
- - David Z. Pan
  - Jae-Seok Yang
  - et al.
- 2009
- ASICON 2009
ELIAD: Efficient Lithography Aware Detailed routing algorithm with compact and macro post-OPC printability prediction
- - Minsik Cho
  - Kun Yuan
  - et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ELIAD: Efficient lithography aware detailed routing algorithm with compact and macro post-OPC printability prediction
- - Minsik Cho
  - Kun Yuan
  - et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems