Orthogonal Defect Classification—A Concept for In-Process Measurements
- Ram Chillarege
- Inderpal S. Bhandari
- et al.
- 1992
- IEEE Transactions on Software Engineering
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.