Waveguide-integrated low-noise Germanium avalanche photodetector with 6dB sensitivity improvement

Abstract

A waveguide-integrated Germanium avalanche photodetector with 6dB sensitivity improvement and excess noise with keff ∼ 0.1 was demonstrated while operating with 12dB gain at around 3V bias voltage. The photodetector was monolithically integrated into front-end CMOS. © 2009 Optical Society of America.