PaperEvidence of intervalley scattering of electrons in the extrinsic photoconductivity of n-type siliconA.A. OntonPhysical Review Letters
PaperReversibility and stability of tellurium alloys for optical data storage applicationsM. Chen, K.A. Rubin, et al.Applied Physics Letters
PaperProbe layer measurements of electroluminescence excitation in ac thin-film devicesV. Marrello, L. Samuelson, et al.Journal of Applied Physics