Paper

01 Jan 1986

VB-2 Laser-Induced Photoemission for Contactless High-Speed IC Testing

View publication

Abstract

No abstract available.

Related

Paper

17ps rise-time measurement by photoemission sampling

Paper

Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications

Paper

Direct and inverse surface photoemission: Sources of ambiguities near the fermi level

Paper

Photoemission sampling measurements of a dispersing voltage pulse traveling on a transmission line

View all publications