R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
J. Tersoff
Applied Surface Science
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990