Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
The tunneling rate is calculated in a AlGaAs (100)-oriented barrier in GaAs, for a Fowler-Nordheim process in which electrons are scattered between the Γ minimum and the four lateral X minima by the alloy disorder. The effective exponent is found to be that given by the transverse X-valley mass, and the prefactor is estimated to be small but not negligible. © 1987.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
T.N. Morgan
Semiconductor Science and Technology
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications