Transmission electron microscopy investigations of defects in molecular beam epitaxy-grown oxide films

Abstract

With a view to increasing the superconductive transition temperature of thin films of La2CuO4 grown by molecular beam epitaxy, films were grown on substrates of lattice parameters such that the film - substrate misfit became small and tensile, or compressive. The microstructure of these films was investigated using transmission electron microscopy and qualitative correlations with physical properties suggested.